Element mapping by X-ray fluorescence spectrometry.

Determining the Content of Silicon Dioxide in Bauxites Using X-Ray Fluorescence Spectrometry

The X-ray fluorescence spectrometry and the MA.BM.006 reference spectrophotometric methods were used to determine the content of SiO2 (%) in bauxites from different deposits. The treatment of samples prior to the analysis involved the following steps: annealing, melting using the borax method,  and the formation of beads. Certified reference bauxite samples were used for the cali...

Quantification in X-Ray Fluorescence Spectrometry

Multielement analysis of soft drinks by X-ray fluorescence spectrometry.

Several commercial soft drinks and respective plastic bottles were analyzed for their multielement contents employing the synchrotron radiation total reflection X-ray fluorescence spectrometry technique (SRTXRF). The SRTXRF method has been developed and validated, and about 20 elements were detected in the investigated samples, including some trace elements, which can be toxic for human beings,...

Optimizing detector geometry for trace element mapping by X-ray fluorescence.

Trace metals play critical roles in a variety of systems, ranging from cells to photovoltaics. X-Ray Fluorescence (XRF) microscopy using X-ray excitation provides one of the highest sensitivities available for imaging the distribution of trace metals at sub-100 nm resolution. With the growing availability and increasing performance of synchrotron light source based instruments and X-ray nanofoc...

The Mapping X - Ray Fluorescence Spectrometer ( Mapx

Thomas Bristow, Robert Downs, Marc Gailhanou, Franck Marchis, Douglas Ming, Richard Morris, Vicente Armando Solé, Kathleen Thompson, Philippe Walter, Michael Wilson, Albert Yen and Samuel Webb, NASA Ames Research Center, Moffett Field, CA [email protected], SETI Institute, Mountain View, CA, Univ. of Arizona, Tucson AZ, IM2NP, Université Paul Cézanne, Marseille, France, NASA Johnson Space Ce...